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An analytical laboratory that excels at root cause failure analysis as well as help eliminte the failure.
  1. Ion Milling / Polishing
    Conventional mechanical sample prep techniques on highly stressed systems or very soft materials can introduce artifacts such as smearing, delamination, and/or edge relief that can distort the observations being made. CMC Laboratories has the ability to Ion Mill or Ion Polish a sample which produces a high quality stress-free cross-section no matter what the material. Ion Polishing can also be used to etch a sample to look at the grain structure in metals.
  2. Chemical / Mechanical Decapsulation
    CMC Laboratories has developed proprietary chemical and mechanical techniques which allows for the removal of packaging material and lids so that further work can be performed. At CMC we take care to perserve underlying structures which is imperative for electrical testing and surface inspection
  3. Reactive Ion Etching (RIE)
    Often the only way to remove certain organics, IDL, nitride, and oxide layers that are highly acid resistant while still maintaining the integrity of the IC, wirebonds, or circuitry is through dry etching. At CMC Laboratories we use inductively coupled plasma etching, along with proprietary gas chemistries and etching profiles that where developed to remove a particular layer species while preserving other layers around it.
  4. Real Time X-ray Analysis
    Non-destructive analysis techniques are crucial in identifying defects prior to destructive analysis. CMC Laboratories' Real Time X-ray allows us to identify and isolate failure signatures like: * Solder voiding * PCB trace issues * Wirebond shorts * Internal package structure * Die attach issues
  5. Metallographic Cross-sections
    To get a full understanding of the construction of a sample or the mechanism of its failure cross-sections are an invaluable tool. At CMC Laboratories we have developed time tested techniques that produce cross-sections that are precise, accurate, and defect free. Most labs have to resort to costly FIB work to achieve the same level of results that we achieve with traditional sample preparation techniques.
  6. Precision Sub-Micron Cross-sections
    In order to
  7. Electrical Component DPA
    This area is fully editable and you can use it to promote your products, services and facilities. You could also use it to display testimonials from your customers speaking of their experience with your services or products.
  8. Micro-Hardness Testing
    Micro-Hardness can provide necessary data of individual macro-structures within a larger matrix. CMC Laboratories has the ability to measure the hardness of ultra thin samples like foils, platings, fibers, passivations, and composite matrices and typical bulk properties of metals, ceramics, plastics, and glasses. Our use of an electromagnetic force motor allows a workable load range from .05gf - 2kgf as well as the ability to vary dwell and load rates.
  9. Our Services
    Aliquam ac sodales felis. Vivamus porttitor dapibus turpis ut molestie. Donec sed elit quis odio molestie condimentum. Integer feugiat urna eget ipsum suscipit scelerisque. Praesent vitae tristique odio.
  10. Laser Flash Thermal Conductivity
    Thermal conductivity and diffusivity are the most important thermophysical material parameters in characterizing how a material or component transports heat. At CMC Laboratories we have developed a 30J Laser Flash technique (LFA) that can take precise measurements of thermophysical properties across various sample form factors. Our techniques have proven itself as a fast, versatile and extremely precise absolute method compared to other LFA methods used in industry.
  11. Energy Dispersive Spectroscopy (EDS)
    CMC Laboratories' has coupled a state of the art Energy Dispersive Spectroscopy (EDS) silicon drift detector (SDD) system with it Scanning Electron Microscope (SEM) system. EDS analysis provides excellent materials characterization by identifying elements contained withing a material system. We have the ability to collect and display compositional data for spots, area scans, line scans, and maps.
  12. SEM Analysis and Imagining
    Scanning Electron Microscopy is the industries go to technique for providing images with optimum contrast to resolve fine features within a sample. CMC Laboratories' Immersion Lens FE-SEM is capable of 500,000x magnification with 0.5nm resolution and can operate at 500v-30kV. Coupled with our low kV Solid State Backscatter Detector we can produce images with contrast levels great enough to show differences in grain orientation. CMC can even output Ultra 4K quality images.
  13. Mechanical Testing
    At CMC Laboratories we know that by understanding the properties of a material system you get a better understanding of how those properties ultimately affect the way a system fails or succeeds. At CMC we offer a wide range of Mechanical Testing services to characterize your material system and understand its operational window.
  14. Prototype Plating
    Description
  15. Image Analaysis
    Description
  1. Ion Milling / Polishing
    Conventional mechanical sample prep techniques on highly stressed systems or very soft materials can introduce artifacts such as smearing, delamination, and/or edge relief that can distort the observations being made. CMC Laboratories has the ability to Ion Mill or Ion Polish a sample which produces a high quality stress-free cross-section no matter what the material. Ion Polishing can also be used to etch a sample to look at the grain structure in metals.
  2. Energy Dispersive Spectroscopy (EDS)
    CMC Laboratories' has coupled a state of the art Energy Dispersive Spectroscopy (EDS) silicon drift detector (SDD) system with it Scanning Electron Microscope (SEM) system. EDS analysis provides excellent materials characterization by identifying elements contained withing a material system. We have the ability to collect and display compositional data for spots, area scans, line scans, and maps.
  3. SEM Analysis and Imagining
    Scanning Electron Microscopy is the industries go to technique for providing images with optimum contrast to resolve fine features within a sample. CMC Laboratories' Immersion Lens FE-SEM is capable of 500,000x magnification with 0.5nm resolution and can operate at 500v-30kV. Coupled with our low kV Solid State Backscatter Detector we can produce images with contrast levels great enough to show differences in grain orientation. CMC can even output Ultra 4K quality images.
Applications
  1. Root Cause FA
    This area is fully editable and you can use it to promote your products, services and facilities. You could also use it to display testimonials from your customers speaking of their experience with your services or products.
  2. Competitive Analysis
    Getting an insight into your competitors product is often the catalyst for real innovation. CMC Laboratories helps you understand the competitive landscape; knowing which products are winning and why can be the difference between growing your revenues and differentiating yourself from the competition – or not.
  3. IC Failure Analysis
    Integrated Circuits (IC) can be extremely complex with problems that can occur across an IC's diffusion structure, metallization layers, or passivation layers. At CMC laboratories our focus is precise and unbiased characterization of failures to understand the root cause mechanism and determine if its a material system problem or a process problem.
  4. Package Structure Evaluation
    Modern packages can be as complex as the IC or circuitry it houses. Packages often have mechanical, electrical, thermal, and form factor constraints on them that push the boundaries of material systems to the edge. At CMC Laboratories we are equipped to analyze all parts of the package from wirebonds, BGAs, ICs, welds, underfill epoxy, die attach, and so much more.
  5. Quality Control
    CMC Laboratories partners with our customers to help them first understand the variables in their production process and how changes in those variables can quantitatively affect their products overall quality. Second, we implement quality control inspections and tests to continually monitor their production process so that we can quickly identify a problem when production yields fall.
  6. Elemental Mapping
    CMC Laboratories has the ability to develop very detailed and precise compositional elemental maps through our SEM and EDS system. Elemental Mapping has a broad scope of applications covering microstructures and nanostructures in ICs, BGAs, packages, wirebonds, welds, and so forth and so on. Mapping not only provides a visual display of a samples composition but relative concentrations and data can also be extracted for compound identification.
  7. Process Consultation
    This area is fully editable and you can use it to promote your products, services and facilities. You could also use it to display testimonials from your customers speaking of their experience with your services or products.
  8. Our Services
    This area is fully editable and you can use it to promote your products, services and facilities. You could also use it to display testimonials from your customers speaking of their experience with your services or products.
  9. Our Services
    Aliquam ac sodales felis. Vivamus porttitor dapibus turpis ut molestie. Donec sed elit quis odio molestie condimentum. Integer feugiat urna eget ipsum suscipit scelerisque. Praesent vitae tristique odio.